IEC 60749-38-2008 半导体器件.机械和气候试验方法.第38部分:带存储器的半导体器件用软错误试验法

作者:标准资料网 时间:2024-05-13 12:10:25  浏览:9978   来源:标准资料网

【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Part38:Softerrortestmethodforsemiconductordeviceswithmemory
【原文标准名称】:半导体器件.机械和气候试验方法.第38部分:带存储器的半导体器件用软错误试验法
【标准号】:IEC60749-38-2008
【标准状态】:现行
【国别】:国际
【发布日期】:2008-02
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC47
【标准类型】:()
【标准水平】:()
【中文主题词】:加速的;α辐射线;气候试验;元件;损伤;缺陷;定义;电气工程;电学测量;电子工程;电子设备及元件;集成电路;干扰;测量;机械试验;电力电子学;半导体器件;半导体;测试;试验条件
【英文主题词】:Accelerated;Alpharadiation;Climatictests;Components;Damage;Defects;Definitions;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Integratedcircuits;Interferences;Measurement;Mechanicaltesting;Powerelectronics;Semiconductordevices;Semiconductors;Testing;Testingconditions
【摘要】:ThispartofIEC60749establishesaprocedureformeasuringthesofterrorsusceptibilityofsemiconductordeviceswithmemorywhensubjectedtoenergeticparticlessuchasalpharadiation.Twotestsaredescribed;anacceleratedtestusinganalpharadiationsourceandan(unaccelerated)real-timesystemtestwhereanyerrorsaregeneratedunderconditionsofnaturallyoccurringradiationwhichcanbealphaorotherradiationsuchasneutron.Tocompletelycharacterizethesofterrorcapabilityofanintegratedcircuitwithmemory,thedevicemustbetestedforbroadhighenergyspectrumandthermalneutronsusingadditionaltestmethods.Thistestmethodmaybeappliedtoanytypeofintegratedcircuitwithmemorydevice.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:26P;A4
【正文语种】:英语